“尘埃”的版本间差异
跳到导航
跳到搜索
无编辑摘要 |
无编辑摘要 |
||
| 第5行： | 第5行： | ||
*尘埃的红外发射: dustEM |
*尘埃的红外发射: dustEM |
||
*尘埃与气体有关，气体的光深可以从low-ionization interstellar (IS) absorption lines(e.g., Si II, O I, Fe II)获得 (Shapley et al. 2003) |
*尘埃与气体有关，气体的光深可以从low-ionization interstellar (IS) absorption lines(e.g., Si II, O I, Fe II)获得 (Shapley et al. 2003) |
||
:e.g. If the two Si II transitions at 1260 and 1527A are optically thin, then the ratio of their equivalent widths will be W1260/W1527 > 6. The observed ratio is W1260/W1527 ~ 1, implying that the lines are saturated and hence their depths are sensitive to the covering fraction of Si II-enriched material. |
|||
2016年6月14日 (二) 08:22的版本
- 消光曲线
- 发射线的消光可能和连续谱的消光不同
- Halpha/Hbeta 线比
- 内禀数值：2.86（恒星形成），3.1（AGN） 参见Osterbrock & Ferland 2006
- 尘埃的红外发射: dustEM
- 尘埃与气体有关，气体的光深可以从low-ionization interstellar (IS) absorption lines(e.g., Si II, O I, Fe II)获得 (Shapley et al. 2003)
- e.g. If the two Si II transitions at 1260 and 1527A are optically thin, then the ratio of their equivalent widths will be W1260/W1527 > 6. The observed ratio is W1260/W1527 ~ 1, implying that the lines are saturated and hence their depths are sensitive to the covering fraction of Si II-enriched material.